Wide-Bandgap Dynamic Reliability & Robustness Power Characterisation Tester
University of Warwick needs a Dynamic Reliability & Robustness Power Characterisation Tester for testing wide-bandgap (SiC and GaN) power semiconductor devices. This is a single instrument purchase worth £277,000.
- Closed7 January 2026
- Value£277k
- BuyerUNIVERSITY OF WARWICK
- WhereUniversity of Warwick
- CategoryLaboratory & precision equipment
- RegionWest Midlands
You'll want to look if you design or supply specialised power semiconductor test and characterisation equipment, particularly for wide-bandgap devices